Top of Interest: Void
Source of void
Void Detected Locations
Mainly between the middle and the top, from the bottom to the top and caught due to lack of time (temperature PROFILE important)
Collapsible ball - 210 ~ 230 ℃
noncollapsible ball - 302℃(90% Pb, 10 Sn) - The frequency of occurrence is also low.
Void Effect
X-ray examination
lThe laminography method is expensive, but it is easy to locate voids.
The transmission method is to locate using the tilting function.
Precautions for X-ray Inspection Instrumentation
Voltage Blooming(Phosphor Blooming)
Countermeasures, use of anti-blooming film
comparison measurement with reference sample
Removal of void
Usually, the ball in the BGA IC has few voids.
Optimizing the time-temperature profile of reflow
Flux amount,type,optimize properties
Void Bidding Criteria
ball size, pitch > smaller ; continuous increase in defect
Location of Void | Class Ⅰ | Class Ⅱ | Class Ⅲ |
---|---|---|---|
Void in ball (dimple)%Dia. / % area | 60% of dia=36% of area | 45% of dia=20 1/4% of area | 30% of dia=9% of area |
50% of dia=25% of area | 35% of dia=12 1/4% of area | 20% of dia=4% of area |
Solder bridge
Opens
Cold solder
bad and process improvement
Insufficient/Nneven Heating
Component Defect